Atomically precise self-assembly of one-dimensional structures on silicon

Applied Surface Science

Volumn 254, Issue 1 SPEC. ISS., 2007, Pages 4-11

  Barke, I ^a   Rugheimer T K ^a   Zheng, Fan ^a   Himpsel, F J ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

Atomic wires; Low dimensional structures; One dimensional physics; Photoelectron spectroscopy; Scanning tunneling microscopy; Scanning tunneling spectroscopy; Silicon surfaces

Indexed keywords

COVALENT BONDS; ENERGY GAP; INTERFACIAL ENERGY; NANOWIRES; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; SCANNING TUNNELING MICROSCOPY; SILICON;

ATOMIC SCALE MEMORY; LOW-DIMENSIONAL STRUCTURES; SCANNING TUNNELING SPECTROSCOPY; SPIN-SPLITTING; SURFACE ELECTRONS;

SELF ASSEMBLY;

EID: 35048826651     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2007.07.085     Document Type: Article

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