SCOPUS 정보 검색 플랫폼

Volumn 14, Issue 35, 2002, Pages 8379-8392

Direct measurement of surface-state conductance by microscopic four-point probe method

(7) Hasegawa, Shuji a Shiraki, Ichiro a Tanikawa, Takehiro a Petersen, Christian L b Hansen, Torben M c Boggild, Peter c Grey, Francois c

a UNIVERSITY OF TOKYO (Japan)

b Capres AS (Denmark)

c TECHNICAL UNIVERSITY OF DENMARK (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

ACTUATORS; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRONS; IONIZATION CHAMBERS; PIEZOELECTRIC DEVICES; SCANNING ELECTRON MICROSCOPY; SURFACE PHENOMENA; VACUUM;

ELECTRON DIFFRACTION CHAMBER; MICROSCOPIC FOUR POINT PROBE METHOD; PIEZOACTUATORS; SURFACE STATE CONDUCTANCE; SURFACE STATE CONDUCTIVITY; ULTAHIGH VACUUM;

ELECTRIC CONDUCTIVITY MEASUREMENT;

EID: 0037048123 PISSN: 09538984 EISSN: None Source Type: Journal
DOI: 10.1088/0953-8984/14/35/309 Document Type: Article

Times cited : (60)

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