Application of electron backscatter diffraction to the study of phase transformations: Present and possible future

Journal of Microscopy

Volumn 233, Issue 3, 2009, Pages 460-473

  Gourgues Lorenzon, A F ^a  

^a CENTRE DES MATÉRIAUX   (France)

Author keywords

Electron backscatter diffraction; Phase transformations; Scanning electron microscopy

Indexed keywords

BACKSCATTERING; DATA HANDLING; ELECTRON DIFFRACTION; ELECTRONS; PHASE TRANSITIONS;

DATA COLLECTION; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION TECHNIQUE; IN-PHASE; PHASES TRANSFORMATION; PHYSICAL MECHANISM; POSSIBLE FUTURES; REAL-TIME INFORMATION;

SCANNING ELECTRON MICROSCOPY;

ACCURACY; ELECTRON BACKSCATTER DIFFRACTION; ELECTRON DIFFRACTION; EVOLUTION; INFORMATION PROCESSING; PRIORITY JOURNAL; REVIEW; STATISTICAL SIGNIFICANCE; THREE DIMENSIONAL IMAGING;

EID: 61549099312     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2009.03130.x     Document Type: Review

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