Phase identification of individual crystalline particles by electron backscatter diffraction

Journal of Microscopy

Volumn 201, Issue 1, 2001, Pages 59-69

  Small, J A ^a   Michael, J R ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

EBSD; Individual particle analysis; Phase identification analysis; SEM

Indexed keywords

BACKSCATTERING; CRYSTALLINE MATERIALS; ELECTRON DIFFRACTION; NANOTECHNOLOGY;

CRYSTALLINE PARTICLES; CRYSTALLOGRAPHIC INFORMATION; DIFFRACTION SYSTEMS; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; ENERGY DISPERSIVE; IDENTIFICATION OF INDIVIDUALS; INDIVIDUAL PARTICLE ANALYSIS; PHASE IDENTIFICATION; PHASE IDENTIFICATION ANALYSE;

CCD CAMERAS;

PHOSPHORUS;

ARTICLE; CAMERA; CRYSTALLOGRAPHY; ELECTRON MICROSCOPY; IMAGE ANALYSIS; PARTICLE SIZE; PRIORITY JOURNAL; SURFACE PROPERTY; X RAY SPECTROMETRY;

EID: 0035134866     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2001.00788.x     Document Type: Article

References (11)

1. High angle Kikuchi patterns
2. Phase identification in a scanning electron microscope using backscattered electron Kikuchi patterns
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5. Electron backscatter diffraction: Applications for nuclear materials
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7. The use of simulated standards in quantitative electron probe microanalysis with energy-dispersive x-ray spectrometry
8. The application of electron backscatter diffraction and orientation contrast imaging on the SEM to textural problems in rocks
9. Phase identification of individual particles by electron backscatter diffraction (EBSD)
10. Electron backscattering patterns. A new technique for obtaining crystallographic information in the scanning electron microscope