On the viability of FIB tomography for generating 3-D orientation maps in deformed and annealed metals

Materials Science Forum

Volumn 550, Issue , 2007, Pages 55-64

  Ferry, M ^a   Xu, W ^a   Mateescu, N ^a   Cairney, J M ^b   Humphreys, F J ^c  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b UNIVERSITY OF SYDNEY   (Australia)

^c UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

EBSD; FIB tomography; Focused ion beam (FIB); Recrystallization; Serial sectioning

Indexed keywords

FIELD EMISSION MICROSCOPES; MICROSTRUCTURE; PARAMETER ESTIMATION; RECRYSTALLIZATION (METALLURGY); SCANNING ELECTRON MICROSCOPY; TOMOGRAPHY;

3-D ORIENTATION MAPS; ANNEALED METALS; CRYSTALLOGRAPHIC FEATURES;

FOCUSED ION BEAMS;

EID: 38449119249     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-434-0.55     Document Type: Conference Paper

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