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Volumn 50, Issue 1, 2005, Pages 87-99
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Rapid spot diffraction patterns identification through template matching
a b |
Author keywords
[No Author keywords available]
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Indexed keywords
CORRELATION METHODS;
CRYSTALLINE MATERIALS;
CRYSTALLOGRAPHY;
DIFFRACTION;
GRAIN BOUNDARIES;
GRAIN SIZE AND SHAPE;
SCANNING ELECTRON MICROSCOPY;
TEXTURES;
TRANSMISSION ELECTRON MICROSCOPY;
CRYSTALLOGRAPHIC STRUCTURES;
DIFFRACTION PATTERNS;
PATTERN IDENTIFICATION;
TEMPLATE MATCHING;
PATTERN MATCHING;
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EID: 20944440838
PISSN: 08607052
EISSN: None
Source Type: Journal
DOI: None Document Type: Conference Paper |
Times cited : (149)
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References (10)
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