New developments of computer-aided crystallographic analysis in transmission electron microscopy

Journal of Applied Crystallography

Volumn 33, Issue 1, 2000, Pages 10-25

  Zaefferer, Stefan ^a  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

METAL;

ARTICLE; COMPUTER AIDED DESIGN; COMPUTER INTERFACE; COMPUTER PROGRAM; CRYSTAL; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; DEFORMITY; DIFFRACTION; FOIL; IMAGE PROCESSING; MEASUREMENT; ORIENTATION; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0034477386     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889899010894     Document Type: Article

References (13)

1. Adams, B. L., Wright, S. I. & Kunze, K. (1993). Met. Trans. A, 24, 819-831.
2. Argilier, S. (1997). Private communications.
3. Banerjee, D., Shelton, C. G., Ralph, B. & Williams, J. C. (1988). Acta Metall. 36, 125-141.
4. Bunge, H. J. (1982). Texture Analysis in Material Science. London: Butterworth.
5. Cromer, D. T. & Mann, J. B. (1968). Acta Cryst. A24, 321-324.
6. Edington, J. W. (1991). Practical Electron Microscopy in Materials Science. Herndon, VA: TechBooks.
7. Haidu, F. (1972). Acta Cryst. A28, 250-252.
8. Hirsch, P. B., Howie, A., Nicholson, R. B., Pashley, D. W. & Whelan, M. J. (1965). Electron Microscopy of Thin Crystals. London: Butterworth.
9. International Tables for X-ray Crystallography (1974). Vol. IV. Birmingham: Kynoch Press.
10. Zaefferer, S., Baudin, T. & Penelle, R. (1999). Acta Mater. Submitted.
11. Zaefferer, S. & Schwarzer, R. A. (1994a). Mater. Sci. Forum, 157-162, 247-251.
12. Zaefferer, S. & Schwarzer, R. A. (1994b). Z. Metallkdunde, 85, 585-591.
13. Zwicker, U. (1974). Titan und Titanlegierungen. Berlin: Springer.