Application of electron backscatter diffraction to grain boundary characterisation

International Materials Reviews

Volumn 49, Issue 1, 2004, Pages 1-11

  Randle, V ^a  

^a SWANSEA UNIVERSITY   (United Kingdom)

Author keywords

Coincidence site lattice; Crystallographic orientation; Electron backscatter diffraction; Grain boundary characterisation; Misorientation

Indexed keywords

BACKSCATTERING; CRYSTAL LATTICES; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; DEFORMATION; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; INTERFACES (MATERIALS); SCANNING ELECTRON MICROSCOPY; STRAIN; TEXTURES; TRANSMISSION ELECTRON MICROSCOPY;

COINCIDENCE SITE LATTICES; CRYSTALLOGRAPHIC ORIENTATIONS; ELECTRON BACKSCATTER DIFFRACTION (EBSD); GRAIN BOUNDARY CHARACTERIZATION;

ELECTRON SCATTERING;

EID: 3042654693     PISSN: 09506608     EISSN: None     Source Type: Journal    
DOI: 10.1179/095066004225010514     Document Type: Review

References (84)

1. D. Raabe, M. Sachtleber, Z. Zhao, F. Roters and S. Zaefferer: Acta Mater., 2001, 49, 3433-3441.
2. J. J. Fundenberger, A. Morawiec, E. Bouzy and J. S. Lecomte: Mater. Chem. Phys., 2003, 81, 535-537.
3. V. Randle: 'Microtexture determination and its applications', 1st edn; 1992, London, The Institute of Materials.
4. V. Randle and O. Engler: 'Introduction to texture analysis: macrotexture, microtexture and orientation mapping"; 2000, London, Taylor and Francis.
5. J. Michael: in 'Electron backscatter diffraction in materials science', (ed. A. J. Schwartz el al.), 75-90; 2000, New York, Kluwer Academic.
6. A. J. Wilkinson: in 'Electron backscatter diffraction in materials science', (ed. A. J. Schwartz et al.), 231-246; 2000, New York, Kluwer Academic.
7. F. J. Humphreys: J. Mater. Sci., 2001, 36, 3833-3854.
8. D. P. Field and H. Weiland: in 'Electron backscatter diffraction in materials science', (ed. A. J. Schwartz et al.), 199-210; 2000, New York, Kluwer Academic.
9. M. P. Black and R. L. Higginson: Scr. Mater., 1999, 41, 125-129.
10. V. Randle: 'Grain boundary geometry in polycrystals'; 1993, Bristol, Institute of Physics Publishing.
11. V. Randle: 'The role of the coincidence site lattice in grain boundary engineering'; 1996, London, The Institute of Materials.
12. V. Randle and C. Hoile: Mater. Sci. Forum, 1998, 273-275, 183-190.
13. V. Randle: Acta Mater., 1998, 46, 1459-1480.
14. D. S. Lee, H. S. Ryoo and S. K. Hwang: Mater. Sci. Eng., 2003, A354, 106-111.
15. M. Shimada, H. Kokawa, Z. J. Wang, Y. S. Sato and I. Karibe: Acta Mater., 2002, 50, 2331-2341.
16. B. Alexandreanu, B. Capell and G. S. Was: Mater. Sci. Eng., 2001, A300, 94-104.
17. M. Kumar, A. J. Schwartz and W. E. King: Acta Mater., 2002, 50, 2599-2612.
18. A.-F. Gourgues: Mater. Sci. Technol., 2002, 18, 119-133.
19. R. A. Schwarzer: in 'Electron backscatter diffraction in materials science', (ed. A. J. Schwartz et al.), 105-122; 2000, New York, Kluwer Academic.
20. D. J. Dingley: in 'Electron backscatter diffraction in materials science', (ed. A. J. Schwartz et al.), 1-18; 2000, New York, Kluwer Academic.
21. V. Rändle: 'Microtexture determination and its applications', 2nd edn; 2003, London, Institute of Materials,.
22. F. J. Humphreys, Y. Huang, I. Brough and C. Harris: J. Microsc., 1999, 195, 212-216.
23. B. S. El-Dasher, B. L. Adams and A. D. Rollett: Scr. Mater., 2003, 48, 141-145.
24. S. D. Terhune, D. L. Swisher, K. Oh-Ishi, Z. Horita, T. G. Langdon and T. R. McNelley: Met, Mater. Trans., 2002, 33A, 2173-2184.
25. Z. J. Li and Q. Liu: Mater. Sci. Eng., 2002, A338, 237-242.
26. D. J. Dingley: J. Microsc., to be published.
27. A. W. Wilson, J. D. Madison and G. Spanos: Scr. Mater., 2001, 45, 1335-1340.
28. M. C. Demirel, B. S. El-Dasher, B. L. Adams and A. D. Rollett: in 'Electron backscatter diffraction in materials science', (ed. A. J. Schwartz et al.), 65-74; 2000, New York, Kluwer Academic.
29. F. F. Lange: Acta Metall., 1967, 15, 311-318.
30. D. Wolf: in 'Materials interfaces: atomic-level structure and properties', (ed. D. Wolf and S. Yip), 1-52; 1992, London, Chapman & Hall.
31. D. M. Saylor, A. Morawiec, K. W. Cherry, F. H. Rogan, G. S. Rohrer, S. Mahadevan and D. Casasent: Mater. Sci. Forum. 2002, 408-412, 1705-1710.
32. C. Bruckner, J. Pospiech, I. Seidl and G. Gottstein: Scr. Mater., 2001, 44, 2635-2640.
33. R. Loloee, W. P. Pratt and M. A. Crimp: Philos. Mag., 2001, 81A, 261-273.
34. D. G. Brandon: Acta Mater., 1966, 14, 1479-1484.
35. F. C. Frank: Metall. Trans., 1988, 19A, 403-409.
36. D. P. Field, J. E. Sanchez, Jr, P. R. Besser and D. J. Dingley: J. Appl. Phys., 1997, 82, 2383-2392.
37. F. Caleyo, T. Baudin, R. Penelle and V. Venegas: Mater. Sci. Eng., 2001, A298, 227-234.
38. V. Randle: Proc. R. Soc., 1990, 431A, 61-69.
39. V. Randle and A. Day: Mater. Sci. Technol., 1993, 9, 1069-1078.
40. K. Rajan: in 'Electron backscatter diffraction in materials science', (ed. A. J. Schwanz et al.), 39-50; 2000, New York, Kluwer Academic.
41. I. Samajdar, P. Ratchev, B. Verlinden and E. Aernoudt: Acta Mater., 2001, 49, 1759-1769.
42. G. L. Wu, A. Godfrey, W. Liu and Q. Liu: Scr. Mater., 2001, 45, 1117-1122.
43. V. Rändle, H. M. Davies and I. Cross: Curr. Opin. Mater. Sci., 2001, 5, 3-8.
44. M. T. Pérez-Prado and T. R. McNelley: Scr. Mater., 1999, 40, 1401-1406.
45. J. P. Chu, J. H. Wu, H. Y. Yasuda, Y. Umakoshi and K. Inoue: Intermetallics, 2000, 8, 39-46.
46. J. K. Mackenzie: Biometrika, 1958, 45, 229-236.
47. M. R. Barnett and F. Montheillet: Acta Mater., 2002, 50, 2285-2296.
48. Y. Huang and F. J. Humphreys: Acta Mater., 1999, 47, 2259-2268.
49. V. Y. Gertsman and S. M. Bruemmer: Acta Mater., 2001, 49, 1589-1598.
50. W. B. Hutchinson, L. Ryde, P. S. Bate and B. Bacroix: Scr. Mater., 1996, 35, 579-582.
51. A. Tatschl and O. Kolednik: Mater. Sci. Eng., 2003, 342A, 152-168.
52. G. Palumbo and K. T. Aust: in 'Materials interfaces: atomic-level structure and properties', (ed. D. Wolf and S. Yip), 190-205; 1992, London, Chapman & Hall.
53. V. Randle and H. Davies: Metall. Mater. Trans.. 2002, 33A, 1853-1857.
54. H. M. Davies and V. Randle: Philos. Mag. A, 2001, 81, 2553-2564.
55. W. E. King and A. J. Schwartz: Scr. Mater., 1998, 38, 449-455.
56. V. Randle: Acta Mater., 1999, 47, 4187-4196.
57. M. Kumar, W. E. King and A. J. Schwartz: Acta Mater., 2000, 48, 2081-2091.
58. J. Bystrzycki, R. A. Varin, M. Nowell and K. J. Kurzydlowski: Intermetallics, 2000, 8, 1049-1059.
59. V. Randle: Interface Sci., 2002, 10, 271-277.
60. E. Bouyne, H. M. Flower, T. C. Lindley and A. Pineau: Scr. Mater., 1998, 39, 295-300.
61. A.-F. Gourgues, H. M. Flower and T. C. Lindley: Mater. Sci. Technol., 2000, 16, 26-40.
62. D. P. Field, H. Weiland and K. Kunze: Can. Metall Q., 1995, 34, 203-210.
63. P. Davies and V. Randle: Mater. Sci. Technol., 2001, 17, 615-626.
64. B. Alexandreanu and G. S. Was: Philos. Mag. A, 2001, 81A, 1951-1965.
65. K. Owusu-Boahen and A. H. King: Scr. Mater., 2000, 42, 301-306.
66. D. J. Prior: J. Microsc., 1999, 195, 217-225.
67. A. J. Wilkinson: Scr. Mater. 2001, 44, 2379-2385.
68. R. K. Davies and V. Randle: Mater. Sci. Eng., 2000, A283, 251-265.
69. A. Semoroz, Y. Durandet and M. Rappaz: Acta Mater., 2001, 49, 529-541.
70. V. Randle: J. Microsc., 1999, 195, 226-232.
71. V. Randle and H. Davies: Ultramicroscopy, 2002, 90, 153-162.
72. C. Leach: Int. J. Inorg. Mater., 2001, 3, 1117-1119.
73. V. Randle: Mater. Charact., 1995, 34, 29-34.
74. Y. Pan, B. L. Adams, T. Olson and N. Panayotou: Acta Mater., 1996, 44, 4685-4695.
75. V. Randle: Scr. Mater., 2001, 44, 2789-2794.
76. S. I. Wright and R. J. Larsen: J. Microsc., 2002, 205 245-252.
77. Y. Pan, T. Olson and B. L. Adams: Can. Metall. Q., 1995, 34, 147.
78. W. E. King, J. S. Stölken, M. Kumar and A. J. Schwartz: in 'Electron backscatter diffraction in materials science', (ed. A. J. Schwartz et al.), 153-170; 2000, New York, Kluwer Academic.
79. R. W. Minich, C. A. Schuh and M. Kumar: Phys. Rev., 2002, 66b, paper 052101.
80. M. A. Wall, A. J. Schwartz and L. Nguyen: Ultramicroscopy, 2001, 88, 73-83.
81. G. T. Wu, B. L. Adams, C. L. Bauer, D. Casasent, A. Morawiec, S. Ozdemir and A. Talukder: Ultramicroscopy, 2002, 93, 99-109.
82. C. A. Schuh, M. Kumar and W. E. King: Acta Mater., 2003, 51, 687-700.
83. M. R. Koblischka and A. Koblischka-Veneva: Physica C: Superconductivity, 2003, 392-396, 545-556.
84. T. Yokomizo, M. Enomoto, O. Umezawa, G. Spanos and R. O. Rosenberg: Mater. Sci Eng., 2003, 344A, 261-267.