Characterisation of fine-scale microstructures by electron backscatter diffraction (EBSD)

Scripta Materialia

Volumn 51, Issue 8 SPEC. ISS., 2004, Pages 771-776

  Humphreys, F J ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Cold working; EBSD; ECAE; FEGSEM; Grain boundaries

Indexed keywords

BACKSCATTERING; CHARGE COUPLED DEVICES; COLD WORKING; DATA ACQUISITION; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; METALLOGRAPHY; OPTICAL MICROSCOPY; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EBSD; ECAE; ELECTRON BACKSCATTER DIFFRACTION (EBSD); EQUAL CHANNEL ANGULAR EXTRUSION (ECAE); FEGSEM; FIELD EMISSION GUN SCANNING ELECTRON MICROSCOPES (FEGSEM);

MICROSTRUCTURE;

EID: 3342908959     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2004.05.016     Document Type: Article

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