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Journal of Materials Science

Volumn 37, Issue 9, 2002, Pages 1715-1746

Electron backscatter Kikuchi diffraction in the scanning electron microscope for crystallographic analysis

(1) Baba Kishi, K Z a

a HONG KONG POLYTECHNIC UNIVERSITY (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SCANNING ELECTRON MICROSCOPY; STRAIN; TRANSMISSION ELECTRON MICROSCOPY;

BACKSCATTER KIKUCHI DIFFRACTION PATTERNS (BKDP); ELECTRON CHANNELLING PATTERNS (ECP);

CRYSTALLOGRAPHY;

EID: 0036571012 PISSN: 00222461 EISSN: None Source Type: Journal
DOI: 10.1023/A:1014964916670 Document Type: Review

Times cited : (98)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.