Crystallographic characterization of sputter-deposited epitaxial Nb-Cu-Co and Nb-Cu-Permalloy multilayers using electron back-scatter diffraction patterns

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 81, Issue 2, 2001, Pages 261-273

  Loloee, R ^a,b   Pratt, W P ^b   Crimp, M A ^a  

^a Michigan State University   (United States)

^b MICHIGAN STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; ELECTRON SCATTERING; EPITAXIAL GROWTH; NIOBIUM ALLOYS; SAPPHIRE; SPUTTER DEPOSITION; THIN FILMS;

DIFFRACTION PATTERNS;

MULTILAYERS;

EID: 0039842123     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418610108214301     Document Type: Article

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