Application of neural networks and genetic algorithms to the screening for high quality chips

Applied Soft Computing Journal

Volumn 9, Issue 2, 2009, Pages 824-832

  Huang, Chenn Jung ^a   Chen, You Jia ^a   Wu, Chi Feng ^b   Huang, Yi An ^b  

^a NATIONAL DONG HWA UNIVERSITY   (Taiwan)

^b NXP SEMICONDUCTORS   (Netherlands)

Author keywords

Cellular neural networks; Defect detection; Genetic algorithm; Median filter; Multilayer perceptron; Single linkage clustering

Indexed keywords

ALGORITHMS; CELLULAR NEURAL NETWORKS; CLUSTERING ALGORITHMS; DEFECTS; DIES; ELECTRIC LOADS; GENETIC ALGORITHMS; MULTILAYER NEURAL NETWORKS; MULTILAYERS;

DEFECT DETECTION; GENETIC ALGORITHM; MEDIAN FILTER; MULTILAYER PERCEPTRON; SINGLE-LINKAGE CLUSTERING;

NEURAL NETWORKS;

EID: 58549119539     PISSN: 15684946     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.asoc.2008.10.002     Document Type: Article

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