Learning vector quantization neural networks for led wafer defect inspection

International Journal of Innovative Computing, Information and Control

Volumn 4, Issue 10, 2008, Pages 2565-2579

  Chang, Chuan Yu ^a   Li, Chun Hsi ^b   Chang, Chin Huang ^a   Jeng, MuDer ^b  

^a NATIONAL YUNLIN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b NATIONAL TAIWAN OCEAN UNIVERSITY   (Taiwan)

Author keywords

Automatic appearance inspection; LED defect inspection; Neural networks

Indexed keywords

EID: 63549110248     PISSN: 13494198     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (14)

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