Prioritizing the application of DFM guidelines based on the detectability of systematic defects

Proceedings of the Asian Test Symposium

Volumn , Issue , 2008, Pages 212-217

  Kim, Dongok ^a   Pomeranz, Irith ^a   Enamul Amyeen, M ^b   Venkataraman, Srikanth ^b  

^a PURDUE UNIVERSITY   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTABILITY; MANUFACTURABILITY; PRIORITIZATION; SYSTEMATIC DEFECTS; TEST SETS;

MACHINE DESIGN;

TESTING;

EID: 58249115436     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2008.69     Document Type: Conference Paper

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