On modeling crosstalk faults

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 24, Issue 12, 2005, Pages 1909-1915

  Kundu, Sandip ^a   Zachariah, Sujit T ^b   Chang, Yi Shing ^b   Tirumurti, Chandra ^b  

^a UNIVERSITY OF MASSACHUSETTS   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

Capacitive crosstalk; Delay fault; Signal integrity testing; Testing

Indexed keywords

COMPUTER SIMULATION; DEFECTS; ELECTRIC FAULT CURRENTS; EQUIPMENT TESTING; NETWORKS (CIRCUITS); PRODUCT DESIGN;

CAPACITIVE CROSSTALK; DELAY FAULT; DIGITAL TESTING; SIGNAL-INTEGRITY TESTING;

CROSSTALK;

EID: 29144501137     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2005.852670     Document Type: Conference Paper

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