Analyzing the Effectiveness of Multiple-Detect Test Sets

IEEE International Test Conference (TC)

Volumn , Issue , 2003, Pages 876-885

  Blanton, R D ^a   Dwarakanath, Kumar N ^a   Shah, Anirudh B ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; STATISTICAL METHODS; VECTORS;

MULTIPLE-DETECT TEST SETS;

DETECTOR CIRCUITS;

EID: 0142184765     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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