Data mining Integrated Circuit fails with fail commonalities

Proceedings - International Test Conference

Volumn , Issue , 2004, Pages 661-668

  Huisman, Leendert M ^a   Kassab, Maroun ^a   Pastel, Leah ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SYSTEMATIC DEFECTS; VOLUME DIAGNOSIS; WAFER LEVEL; WAFER STRENGTH;

APPLICATION SPECIFIC INTEGRATED CIRCUITS; DATA ACQUISITION; DATA MINING; LOGIC DESIGN; LOGIC GATES; MICROPROCESSOR CHIPS; RANDOM ACCESS STORAGE;

INTEGRATED CIRCUIT TESTING;

EID: 14844366560     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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