Gate exhaustive testing

Proceedings - International Test Conference

Volumn 2005, Issue , 2005, Pages 771-777

  Kyoung, Youn Cho ^a   Mitra, Subhasish ^a,b   McCluskey, Edward J ^a  

^a Stanford University   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DETECT TEST SETS; FAULT TEST METRICS; GATE EXHAUSTIVE TESTING; SCAN CELLS;

ELECTRIC FAULT CURRENTS; LOGIC GATES; MICROPROCESSOR CHIPS;

ELECTRONIC EQUIPMENT TESTING;

EID: 33847097155     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2005.1584040     Document Type: Conference Paper

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