Deformations of IC Structure in Test and Yield Learning

IEEE International Test Conference (TC)

Volumn , Issue , 2003, Pages 856-865

  Maly, W ^a   Gattiker, A ^b   Zanon, T ^a   Vogels, T ^a   Blanton, R D ^a   Storey, T ^b  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b NONE

Author keywords

Defect characterization; Defects; Diagnosis; Fault modeling; Yield learning

Indexed keywords

BOOLEAN ALGEBRA; DEFORMATION; NETWORKS (CIRCUITS);

YIELD LEARNING;

INTEGRATED CIRCUITS;

EID: 0142246882     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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