Systematic defects in deep sub-micron technologies

Proceedings - International Test Conference

Volumn , Issue , 2004, Pages 290-299

  Kruseman, Bram ^a   Majhi, Ananta ^a   Hora, Camelia ^a   Eichenberger, Stefan ^b   Meirlevede, Johan ^b  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

^b NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COST EFFECTIVENESS; DEMODULATION; ELECTRIC POTENTIAL; ENERGY UTILIZATION; PROBLEM SOLVING; SIZE DETERMINATION; TOPOLOGY;

INSPECTION TOOLS; MANUFACTURING TESTS; SUB-MICRON TECHNOLOGIES; SYSTEMATIC DEFECTS;

DIGITAL CIRCUITS;

EID: 18144415503     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)

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