Reduction of SOC test data volume, scan power and testing time using alternating run-length codes

Proceedings - Design Automation Conference

Volumn , Issue , 2002, Pages 673-678

  Chandra, Anshuman ^a   Chakrabarty, Krishnendu ^a  

^a Duke University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DATA COMPRESSION; ESTIMATION; VECTORS;

SYSTEMS ON A CHIP (SOC);

MICROPROCESSOR CHIPS;

EID: 0036048211     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/513918.514090     Document Type: Conference Paper

References (21)

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