DFT for high-quality low cost manufacturing test

Proceedings of the Asian Test Symposium

Volumn , Issue , 2001, Pages 3-8

  Rajski, Janusz ^a  

^a MENTOR GRAPHICS CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COST EFFECTIVENESS; ELECTRONICS INDUSTRY; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE TESTING;

HIGH QUALITY LOW COST MANUFACTURING TEST; SEMICONDUCTOR INDUSTRY; TESTER LIMITED FABS;

DESIGN FOR TESTABILITY;

EID: 0035701460     PISSN: None     EISSN: None     Source Type: Journal    
DOI: 10.1109/ATS.2001.990250     Document Type: Article

References (0)