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Volumn 40, Issue 10, 2008, Pages 780-791

Intergranular thermal fatigue damage evolution in SnAgCu lead-free solder

Author keywords

Cohesive zone modeling; Lead free solder; Thermal fatigue

Indexed keywords

AGRICULTURAL PRODUCTS; ARSENIC; BRAZING; COATING TECHNIQUES; CRYSTAL GROWTH; CRYSTALLOGRAPHY; ELASTIC MODULI; ELECTRIC CURRENTS; ELECTRONIC EQUIPMENT MANUFACTURE; ELECTRONICS INDUSTRY; EVOLUTIONARY ALGORITHMS; FATIGUE OF MATERIALS; GRAIN (AGRICULTURAL PRODUCT); GRAIN BOUNDARIES; LEAD; LITHOGRAPHY; METALS; MICROSTRUCTURAL EVOLUTION; MICROSTRUCTURE; MORPHOLOGY; PHASE BOUNDARIES; SEPARATION; SOLDERED JOINTS; SOLDERING; SULFATE MINERALS; TESTING; THERMAL FATIGUE; TIN ALLOYS; WELDING;

EID: 45849133746     PISSN: 01676636     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mechmat.2008.04.005     Document Type: Article
Times cited : (49)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.