Combining dictionary coding and LFSR reseeding for test data compression

Proceedings - Design Automation Conference

Volumn , Issue , 2004, Pages 944-947

  Sun, Xiaoyun ^a   Kinney, Larry ^a   Vinnakota, Bapiraju ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

Built In Self Test; VLSI test

Indexed keywords

ALGORITHMS; BANDWIDTH; BENCHMARKING; COMBINATORIAL CIRCUITS; COMPUTATIONAL COMPLEXITY; DATA TRANSFER; ENCODING (SYMBOLS); HEURISTIC PROGRAMMING; LINEAR EQUATIONS; VLSI CIRCUITS;

BUILT-IN SELF-TEST (BIST); DICTIONARY CODING; GOLOMB CODING; STATISTICAL CODING;

DATA COMPRESSION;

EID: 4444343146     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/996566.996816     Document Type: Conference Paper

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