X-ray photoelectron diffraction from (3x3) and (√3x√3)R30° (0001)Si 6H-SiC surfaces

Journal of Applied Physics

Volumn 84, Issue 11, 1998, Pages 6042-6048

  King, S W ^a   Ronning, C ^a   Davis, R F ^a   Busby, R S ^b   Nemanich, R J ^b  

^a North Carolina State University   (United States)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001358207     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368879     Document Type: Article

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