Surface core-level shift photoelectron diffraction study of β-SiC(001)-c(2 × 2) surface

Surface Science

Volumn 438, Issue 1-3, 1999, Pages 237-241

  Shimomura, M ^a   Yeom, H W ^b   Mun, B S ^c   Fadley, C S ^c   Hara, S ^d   Yoshida, S ^d   Kono, S ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^d ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; CHEMICAL BONDS; COMPUTER SIMULATION; ELECTRON DIFFRACTION; MATHEMATICAL MODELS; RELAXATION PROCESSES; SURFACE STRUCTURE;

BRIDGE DIMER MODEL; PHOTOELECTRON DIFFRACTION; SURFACE RECONSTRUCTION; SURFACE RELAXATION;

SILICON CARBIDE;

EID: 0033343793     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00575-0     Document Type: Article

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