Theory of phase-modulation atomic force microscopy with constant-oscillation amplitude

Journal of Applied Physics

Volumn 103, Issue 6, 2008, Pages

  Hölscher, Hendrik ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FEEDBACK; PHASE MODULATION; SPECTROSCOPIC ANALYSIS;

DISTANCE CURVES; DYNAMIC FORCE SPECTROSCOPY; OSCILLATION AMPLITUDE;

AMPLITUDE MODULATION;

EID: 41549117574     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2896450     Document Type: Article

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