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Surface Science

Volumn 515, Issue 2-3, 2002, Pages 517-522

Q-controlled dynamic force spectroscopy

(1) Hölscher, Hendrik a

a CENTER OF ADVANCED EUROPEAN STUDIES AND RESEARCH CAESAR (Germany)

Author keywords

Atomic force microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; FREQUENCIES; ULTRAHIGH VACUUM;

DYNAMIC FORCE SPECTROSCOPY;

SURFACE STRUCTURE;

EID: 0036717851 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(02)01971-4 Document Type: Article

Times cited : (16)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.