Monolayer oxidation on Si (001) - (2×1) studied by means of reflectance difference spectroscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 77, Issue 8, 2008, Pages

  Ohno, S ^a   Kobayashi, H ^a   Mitobe, F ^a   Suzuki, T ^b   Shudo, K ^a   Tanaka, M ^a  

^a YOKOHAMA NATIONAL UNIVERSITY   (Japan)

^b NATIONAL DEFENSE ACADEMY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 40849147174     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.77.085319     Document Type: Article

References (31)

1. J. F. McGilp, Prog. Surf. Sci. PSSFBP 0079-6816 10.1016/0079-6816(95) 00034-V 49, 1 (1995);
2. P. Weightman, D. S. Marin, R. J. Cole, and T. Farrell, Rep. Prog. Phys. RPPHAG 0034-4885 10.1088/0034-4885/68/6/R01 68, 1251 (2005).
3. F. Fuchs, W. G. Schmidt, and F. Bechstedt, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.72.075353 72, 075353 (2005).
4. S. Sayan, E. Garfunkel, and S. Suzer, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1450049 80, 2135 (2002).
5. T. Yasuda, N. Kumagai, M. Nishizawa, S. Yamasaki, H. Oheda, and K. Yamabe, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.67.195338 67, 195338 (2003).
6. Y. Takakuwa, F. Ishida, and T. Kawawa, Appl. Surf. Sci. ASUSEE 0169-4332 190, 20 (2002);
7. Y. Takakuwa, F. Ishida, and T. Kawawa, Appl. Surf. Sci. ASUSEE 0169-4332 216, 133 (2003).
8. M. Suemitsu, Y. Enta, Y. Miyanishi, and N. Miyamoto, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.82.2334 82, 2334 (1999).
9. V. D. Borman, E. P. Gusev, Yu. Yu. Lebedinskii, and V. I. Troyan, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.67.2387 67, 2387 (1991).
10. J. V. Seiple and J. P. Peltz, J. Vac. Sci. Technol. A JVTAD6 0734-2101 10.1116/1.579825 13, 772 (1995).
11. J. Takizawa, S. Ohno, J. Koizumi, K. Shudo, and M. Tanaka, J. Phys.: Condens. Matter JCOMEL 0953-8984 10.1088/0953-8984/18/17/L01 18, L209 (2006).
12. Y. Borensztein, O. Pluchery, and N. Witkowski, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.95.117402 95, 117402 (2005).
13. A. I. Shkrebtii and R. Del Sole, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.70.2645 70, 2645 (1993).
14. T. Nakayama and M. Murayama, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1334647 77, 4286 (2000).
15. T. Yasuda, S. Yamasaki, M. Nishizawa, N. Miyata, A. Shklyaev, M. Ichikawa, T. Matsudo, and T. Ohta, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.87.037403 87, 037403 (2001).
16. K. Kato, T. Uda, and K. Terakura, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.80.2000 80, 2000 (1998).
17. H. Watanabe, K. Kato, T. Uda, K. Fujita, M. Ichikawa, T. Kawamura, and K. Terakura, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.80.345 80, 345 (1998).
18. Y. Enta, Y. Takegawa, M. Suemitsu, and N. Miyamoto, Appl. Surf. Sci. ASUSEE 0169-4332 100/101, 449 (1996).
19. D. E. Aspnes, J. P. Harbison, A. A. Studna, and L. T. Florez, J. Vac. Sci. Technol. A JVTAD6 0734-2101 10.1116/1.575694 6, 1327 (1988).
20. N. Witkowski, R. Coustel, O. Pluchery, and Y. Borensztein, Surf. Sci. SUSCAS 0039-6028 600, 5142 (2006).
21. R. Shioda and J. van der Weide, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.57.R6823 57, R6823 (1998).
22. T. Yasuda, M. Nishizawa, N. Kumagai, S. Yamasaki, H. Oheda, and K. Yamabe, Thin Solid Films THSFAP 0040-6090 455-456, 759 (2004).
23. S. Ogawa and Y. Takakuwa, Jpn. J. Appl. Phys., Part 2 JAPLD8 0021-4922 44, L1048 (2005).
24. C.-H. Chung, H. W. Yeom, B. D. Yu, and I.-W. Lyo, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.97.036103 97, 036103 (2006).
25. X. L. Fan, Y. F. Zhang, W. M. Lau, and Z. F. Liu, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.94.016101 94, 016101 (2005).
26. Ph. Avouris and C. Cahill, Ultramicroscopy ULTRD6 0304-3991 42-44, 838 (1992).
27. B. D. Yu, Young Jin Kim, J. Jeon, H. Kim, H. W. Yeom, I. W. Lyo, K.-J. Kong, Y. Miyamoto, O. Sugino, and T. Ohno, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.70.033307 70, 033307 (2004).
28. H. Kageshima and K. Shiraishi, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.81.5936 81, 5936 (1998).
29. A. Incze, R. Del Sole, and G. Onida, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.71.035350 71, 035350 (2005).
30. T. Uchiyama and M. Tsukada, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.55.9356 55, 9356 (1997).
31. R. Kliese, B. Röttger, D. Badt, and H. Neddermeyer, Ultramicroscopy ULTRD6 0304-3991 42-44, 824 (1992).