RAS: An efficient probe to characterize Si(0 0 1)-(2 × 1) surfaces

Surface Science

Volumn 600, Issue 24, 2006, Pages 5142-5149

  Witkowski, N ^a   Coustel, R ^a   Pluchery, O ^a   Borensztein, Y ^a  

^a INSTITUT DES NANOSCIENCES DE PARIS   (France)

Author keywords

Adsorbate; Reflectance anisotropy spectroscopy; Scanning tunneling microscopy; Si(0 0 1)

Indexed keywords

ADSORPTION; ANISOTROPY; CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; SCANNING TUNNELING MICROSCOPY; SPECTROSCOPIC ANALYSIS;

ADSORBATES; QUALITATIVE INFORMATION; REFLECTANCE ANISOTROPY SPECTROSCOPY (RAS);

SILICON;

EID: 33845229132     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.08.045     Document Type: Article

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