Reflectance difference spectroscopy of highly oriented (2×1) reconstructed Si(001) surfaces

Physical Review B - Condensed Matter and Materials Physics

Volumn 57, Issue 12, 1998, Pages R6823-R6825

  Shioda, Ryu ^a   van der Weide, Jaap ^a  

^a ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001444512     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.57.R6823     Document Type: Article

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