Real-time TEM imaging of the formation of crystalline nanoscale gaps

Physical Review Letters

Volumn 100, Issue 5, 2008, Pages

  Strachan, Douglas R ^a,b   Johnston, Danvers E ^a   Guiton, Beth S ^b   Datta, Sujit S ^a   Davies, Peter K ^b   Bonnell, Dawn A ^b   Johnson, A T Charlie ^a,b  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMIGRATION; ENERGY GAP; FEEDBACK CONTROL; MELTING; REAL TIME SYSTEMS;

FAILURE MECHANISM; NANOGAP FORMATION; THERMAL RUNAWAY;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 38949163596     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.100.056805     Document Type: Article

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