Coulomb blockade phenomena in electromigration break junctions

Applied Physics Letters

Volumn 87, Issue 1, 2005, Pages

  Sordan, R ^a   Balasubramanian, K ^a   Burghard, M ^a   Kern, K ^a  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

GAP JUNCTIONS; NANOCLUSTERS; NANOWIRES; SINGLE-ELECTRON TUNNELLING;

COULOMB BLOCKADE; ELECTRIC CONDUCTANCE; ELECTROMIGRATION; ELECTRON TUNNELING; GOLD COMPOUNDS; NANOSTRUCTURED MATERIALS; PALLADIUM;

SEMICONDUCTOR JUNCTIONS;

EID: 24144442154     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1991988     Document Type: Article

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