Parallel fabrication of nanogap electrodes

Nano Letters

Volumn 7, Issue 9, 2007, Pages 2774-2777

  Johnston, Danvers E ^a   Strachan, Douglas R ^a,b   Johnson, A T Charlie ^a,b  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRODES; ELECTROMIGRATION; SEMICONDUCTOR JUNCTIONS;

MOLECULAR-SCALE ELECTRONIC DEVICES; NANOELECTRODES; NANOGAP JUNCTIONS;

NANOSTRUCTURED MATERIALS;

GOLD; NANOMATERIAL;

ARTICLE; CHEMISTRY; COMPUTER AIDED DESIGN; CRYSTALLIZATION; EQUIPMENT; EQUIPMENT DESIGN; IMPEDANCE; INSTRUMENTATION; MATERIALS TESTING; METHODOLOGY; MICROELECTRODE; NANOTECHNOLOGY; PARTICLE SIZE; ULTRASTRUCTURE;

COMPUTER-AIDED DESIGN; CRYSTALLIZATION; ELECTRIC IMPEDANCE; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; GOLD; MATERIALS TESTING; MICROELECTRODES; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE;

EID: 34948854906     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl0713169     Document Type: Article

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