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Volumn 88, Issue 22, 2006, Pages

Current-driven interactions between voids in metallic interconnect lines and their effects on line electrical resistance

Author keywords

[No Author keywords available]

Indexed keywords

METALLIC INTERCONNECT LINES; VOID INTERACTIONS; VOID MIGRATION;

EID: 33744829484     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2207849     Document Type: Article
Times cited : (22)

References (21)
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