Biased surface fluctuations due to current stress

Physical Review Letters

Volumn 99, Issue 20, 2007, Pages

  Bondarchuk, O ^a,c   Cullen, W G ^a   Degawa, M ^a   Williams, E D ^a   Bole, T ^b   Rous, P J ^b  

^a UNIVERSITY OF MARYLAND   (United States)

^b UNIVERSITY OF MARYLAND BALTIMORE COUNTY   (United States)

^c FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ADATOMS; ELECTRIC CONDUCTIVITY; IMAGING TECHNIQUES; MOMENTUM TRANSFER; SURFACE ANALYSIS; THIN FILMS;

BIASED SURFACE FLUCTUATIONS; ELECTRON WIND FORCE; STM IMAGING;

BIAS CURRENTS;

EID: 36148980074     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.99.206801     Document Type: Article

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