Using noise for controlled disassembly of nanoscale gold wires

Nanotechnology

Volumn 17, Issue 20, 2006, Pages 5124-5130

  Dong, Jianchun ^a   Parviz, Babak A ^a  

^a University of Washington   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIAS VOLTAGE; BREAKING PROCESS; NANOSCALE GOLD WIRES; VOLTAGE-RAMP ALGORITHM;

ELECTRIC CONDUCTANCE; ELECTRON BEAM LITHOGRAPHY; FEEDBACK CONTROL; GOLD COMPOUNDS; HEATING; SILICON NITRIDE; TRANSMISSION ELECTRON MICROSCOPY;

SEMICONDUCTOR QUANTUM WIRES;

EID: 33749514442     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/20/014     Document Type: Article

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