Real-space imaging of current distributions at the submicron scale using magnetic force microscopy: Inversion methodology

Journal of Applied Physics

Volumn 95, Issue 5, 2004, Pages 2477-2486

  Rous, P J ^a   Yongsunthon, R ^b   Stanishevsky, A ^b,c   Williams, E D ^b  

^a UNIVERSITY OF MARYLAND BALTIMORE COUNTY   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

^c UNIVERSITY OF ALABAMA AT BIRMINGHAM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DISTRIBUTIONS; MAGNETIC FORCE MICROSCOPY;

CURRENT DENSITY; ELECTROMIGRATION; IMAGE ANALYSIS; MAGNETIC FIELD EFFECTS; MATHEMATICAL MODELS; OPTICAL RESOLVING POWER;

IMAGING TECHNIQUES;

EID: 1642321101     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1641149     Document Type: Article

References (45)

1. C. V. Thompson and J. R. Lloyd, Mater. Res. Bull. 18, 19 (1993).
2. J. R. Lloyd, AIP Conf. Proc. 612, 3 (2002).
3. O. Kraft and E. Arzt, Appl. Phys. Lett. 66, 2063 (1995).
4. M. Mahadevan, R. M. Bradley, and J.-M. Debierre, Europhys. Lett. 45, 680 (1999).
5. M. R. Gungor and D. Maraudas, J. Appl. Phys. 85, 2233 (1999).
6. M. R. Gungor and D. Maroudas, Surf. Sci. Lett. 415, 1055 (1998).
7. D. Maroudas, M. R. Gungor, H. S. Ho, and M. N. Enmark, Mater. Res. Soc. Symp. Proc. 505, 249 (1998).
8. E. C. C. Yeh and K. N. Tu, J. Appl. Phys. 88, 5680 (2000).
9. K. N. Tu, C. C. Yeh, C. Y. Liu, and C. Chen, Appl. Phys. Lett. 76, 988 (2000).
10. Z. Suo, W. Wang, and M. Yang, Appl. Phys. Lett. 64, 1944 (1994).
11. D. Maroudas, Appl. Phys. Lett. 67, 798 (1995).
12. S. Chatraphorn, E. F. Fleet, F. C. Wellstood, L. A. Knauss, and T. M. Elles, Appl. Phys. Lett. 76, 2304 (2000).
13. B. J. Roth, N. G. Sepulveda, and J. J. P. Wikswo, J. Appl. Phys. 65, 361 (1989).
14. J. J. P. Wikswo, SQUID Sensors: Fundamentals, Fabrication, and Applications (1996), pp. 629-696.
15. E. H. Brandt, Phys. Rev. B 46, 8628 (1992).
16. Y. Radzyner, Y. Abulafia, Y. Yeshurun, T. Staiger, and G. Fuchs, Physica C 307, 165 (1998).
17. A. E. Pashitski, A. Gurevich, A. A. Polyanskii, D. C. Larbalestier, A. Goyal, E. D. Specht, D. M. Koeger, J. A. DeLuca, and J. E. Tkaczyk, Science 275, 367 (1997).
18. T. H. Johansen, M. Baziljevich, H. Bratsberg, Y. Galperin, P. E. Lindelof, Y. Shen, and P. Vase, Phys. Rev. B 54, 16264 (1996).
19. J.-G. Zhu, X. Lin, and S. Rick, J. Appl. Phys. 83, 6223 (1998).
20. H. J. Mamin, D. Rugar, J. E. Stern, B. D. Terris, and S. E. Lambert, Appl. Phys. Lett. 53, 1563 (1988).
21. P. J. A. v. Schendel, H. J. Hug, B. Stiefel, S. Martin, and H.-J. Guntherodt, J. Appl. Phys. 99, 435 (2000).
22. M. W. Coffey, Phys. Rev. B 57, 11648 (1998).
23. M. W. Coffey, Phys. Rev. Lett. 83, 1648 (1999).
24. A. Badía, Phys. Rev. B 63, 094502 (2001).
25. G. Binnig, C. F. Quate, and C. Gerber, Phys. Rev. Lett. 56, 930 (1986).
26. P. Grütter, D. Rugar, H. J. Mamin, G. Castillo, C.-J. Lin, I. R. MCFadyen, R. M. Valletta, O. Wolter, T. Bayer, and J. Greschner, J. Appl. Phys. 69, 5883 (1991).
27. P. Grutter, E. Meyer, H. Heinzelmann, L. Rosenthaler, H.-R. Hidber, and H.-J. Guntherodt, J. Vac. Sci. Technol. A 6, 279 (1996).
28. G. D. Skidmore and E. D. Dahlberg, Appl. Phys. Lett. 71, 3293 (1997).
29. R. Proksoh, G. D. Skidmore, E. D. Dahlberg, S. Foss, J. J. Schmidt, C. Merton, B. Walsh, and M. Dugas, Appl. Phys. Lett. 69, 2599 (1996).
30. T. Goddenhenrich, H. Lemke, M. Muck, U. Hartmann, and C. Heiden, Appl. Phys. Lett. 57, 2612 (1990).
31. P. J. A. v. Schendel, H. J. Hug, B. Stiefel, S. Martin, and H.-J. Guntherodt, J. Appl. Phys. 99, 435 (2000).
32. R. D. Gomez, A. O. Pak, A. J. Anderson, E. R. Burke, A. J. Leyendecker, and I. D. Mayergoyz, J. Appl. Phys. 83, 6226 (1998).
33. L. Kong and S. Y. Chou, Appl. Phys. Lett. 70, 2043 (1997).
34. S. MCVitie, R. P. Ferrier, J. Scott, G. S. White, and A. Gallagher, J. Appl. Phys. 89, 3656 (2001).
35. J. Lohau, S. Kirsch, A. Carl, G. Dumpich, and E. F. Wassermann, J. Appl. Phys. 86, 3410 (1999).
36. J. H. MCCoy, Master's thesis, University of Maryland, College Park, 2001.
37. R. Yongsunthon, Doctoral thesis, University of Maryland, College Park, 2002.
38. R. Yongsunthon, J. MCCoy, and E. D. Williams, J. Vac. Sci. Technol. 19, 1763 (2001).
39. R. Yongsunthon, J. MCCoy, and E. D. Williams, Proceedings of the ULSI Metrology Conference (2001), Vol. 550, pp. 630-634.
40. S. Chatraphom, C. F. Fleet, and F. C. Wellstood, J. Appl. Phys. 92, 4731 (2002).
41. J. Melngailis, J. Vac. Sci. Technol. B 5, 469 (1987).
42. Y.-C. Joo and C. V. Thompson, J. Appl. Phys. 81, 6062 (1997).
43. Y.-C. Joo, C. V. Thompson, S. P. Baker, and E. Arzt, J. Appl. Phys. 85, 2108 (1999).
44. R. J. Gleixner and W. D. Nix, J. Appl. Phys. 86, 1932 (1999).
45. R. Yongsunthon, A. Stanishevsky, P. Rous, and E. D. Williams, Mater. Res. Soc. Symp. Proc. 738, G5.6.1-6 (2003).