RF MEMS testing-beyond the S-parameters

IEEE Microwave Magazine

Volumn 8, Issue 6, 2007, Pages 76-88

  Ebel, John L ^a   Hyman, Daniel J ^b   Newman, Harvey S ^c  

^a AIR FORCE RESEARCH LABORATORY   (United States)

^b XCOM Wireless Inc   (United States)

^c NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIAS TREES; DIODE DETECTORS; S-PARAMETER DATA; SWITCH PARAMETERS;

CATHODE RAY OSCILLOSCOPES; CHARACTERIZATION; CONTACT RESISTANCE; PULSE AMPLIFIERS; SCATTERING PARAMETERS; TIME DOMAIN ANALYSIS;

MEMS;

EID: 37349030362     PISSN: 15273342     EISSN: None     Source Type: Trade Journal    
DOI: 10.1109/MMM.2007.907737     Document Type: Article

References (23)

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