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Volumn 2005, Issue , 2005, Pages 745-748

Miniature RF MEMS switched capacitors

Author keywords

Capacitors; Reliability; RF MEMS; Switching speed

Indexed keywords

COMPUTER SIMULATION; DIELECTRIC PROPERTIES; ELECTRIC CONDUCTORS; ELECTRIC POTENTIAL; ELECTRIC SWITCHES; RELIABILITY; WAVEGUIDES;

EID: 33749237545     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSYM.2005.1516719     Document Type: Conference Paper
Times cited : (35)

References (4)
  • 4
    • 2342654536 scopus 로고    scopus 로고
    • Simulation and measurement of dielectric charging in electrostatically actuated capacitive microwave switches
    • J. Robert Reid, "Simulation and measurement of dielectric charging in electrostatically actuated capacitive microwave switches," Nanotech Int. Conf. Proc., vol. 1, pp. 250-253, 2002.
    • (2002) Nanotech Int. Conf. Proc. , vol.1 , pp. 250-253
    • Reid, J.R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.