Focused ion-beam milling for field-ion specimen preparation: Preliminary investigations

Ultramicroscopy

Volumn 75, Issue 3, 1998, Pages 147-159

  Larson, D J ^a,b   Foord, D T ^c   Petford Long, A K ^a   Anthony, T C ^d   Rozdilsky, I M ^a   Cerezo, A ^a   Smith, G W D ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^d HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

Field ion microscopy; Specimen preparation and handling

Indexed keywords

COPPER ALLOYS; ELECTRON ENERGY LEVELS; GALLIUM; ION BEAMS; SPECIMEN PREPARATION;

FIELD ION MICROSCOPY; FIELD ION SPECIMEN PREPARATION; FOCUSED ION BEAM MILLING;

ION MICROSCOPES;

COBALT; COPPER; GALLIUM;

ARTICLE; CRYSTAL; ELECTRON MICROSCOPY; IMAGING SYSTEM; METALLURGY; SURFACE PROPERTY;

EID: 0032442759     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(98)00058-8     Document Type: Article

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