Site-specific specimen preparation for atom probe tomography of grain boundaries

Physica B: Condensed Matter

Volumn 394, Issue 2, 2007, Pages 267-269

  Cairney, J M ^a   Saxey, D W ^a   McGrouther, D ^b   Ringer, S P ^a  

^a UNIVERSITY OF SYDNEY   (Australia)

^b UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

Atom probe tomography (APT); Focused ion beam (FIB); Site specific specimen preparation

Indexed keywords

ELECTROLYTIC POLISHING; FOCUSED ION BEAMS; GRAIN BOUNDARIES; MICROMANIPULATORS; SCANNING ELECTRON MICROSCOPY;

ATOM PROBE TOMOGRAPHY (APT); SITE-SPECIFIC SPECIMEN PREPARATION;

TOMOGRAPHY;

EID: 34247349096     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2006.12.024     Document Type: Article

References (8)

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8. D.W. Saxey, J.M. Cairney, D. McGrouther, T. Honma S.P. Ringer, Unltramicroscopy, submitted for publication, 2006.