Site-specific specimen preparation technique for atom probe analysis of grain boundaries

Microscopy and Microanalysis

Volumn 12, Issue SUPPL. 2, 2006, Pages 1740-1741

  Lawrence, D ^a   Thompson, K ^a   Larson, D J ^a  

^a Imago Scientific Instruments   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750858149     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S143192760606394X     Document Type: Conference Paper

References (3)

1. T.F. Kelly and T.T. Gribb, et al. Microscopy and Microanalysis 10 (2004) 373
2. M. K. Miller, K. F. Russell and G. B. Thompson, Ultramicroscopy, 102 (2005) 287-298.
3. D.J. Larson, et al, Microscopy and Microanalysis 7, (2001) 24.