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Volumn 401-402, Issue , 2007, Pages 639-645

From extended defects and interfaces to point defects in three dimensions-The case of InxGa1-xN

Author keywords

HRTEM; InxGa1 xN; Indium precipitates; InN band gap; Noise limits

Indexed keywords

ENERGY GAP; PHOTOLUMINESCENCE; RADIATION DAMAGE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 36048958230     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physb.2007.09.041     Document Type: Article
Times cited : (6)

References (40)
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    • http://www.lbl.gov/LBL-Programs/TEAM/index.html.
  • 17
    • 0007674442 scopus 로고    scopus 로고
    • Gallium nitride
    • Pankove J.I., and Moustakas T.D. (Eds), Academic Press
    • Kisielowski C. Gallium nitride. In: Pankove J.I., and Moustakas T.D. (Eds). Semiconductors and Semimetals vol. 57 (1999), Academic Press 257
    • (1999) Semiconductors and Semimetals , vol.57 , pp. 257
    • Kisielowski, C.1
  • 34
    • 36049000154 scopus 로고    scopus 로고
    • C. Kisielowski, T.P. Bartel, Appl. Phys. Lett. (2007), in press.
  • 40
    • 36048960409 scopus 로고    scopus 로고
    • P. Specht, W. Hong, E.R. Weber, MRS (2007), in press.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.