Discrete tomography of Ga and InGa particles from HREM image simulation and exit wave reconstruction

Materials Research Society Symposium Proceedings

Volumn 839, Issue , 2005, Pages 99-104

  Jinschek, J R ^a   Calderon, H A ^b   Batenburg, K J ^c   Radmilovic, V ^a   Kisielowski, Ch ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b INSTITUTO POLITÉCNICO NACIONAL   (Mexico)

^c LEIDEN UNIVERSITY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; COMPUTER SIMULATION; ELECTRIC POTENTIAL; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE PROCESSING; INDIUM COMPOUNDS; NANOSTRUCTURED MATERIALS; PARAMETER ESTIMATION;

DISCRETE TOMOGRAPHY; HIGH VOLTAGE ELECTRON MICROSCOPY; IMAGE SIMULATION; VOLUMETRIC RECONSTRUCTION;

TOMOGRAPHY;

EID: 23844527472     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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