On the geometrical and electronic structure of an ultra-thin crystalline silica film grown on Mo(1 1 2)

Surface Science

Volumn 601, Issue 21, 2007, Pages 4849-4861

  Kaya, S ^a   Baron, M ^a   Stacchiola, D ^a   Weissenrieder, J ^a   Shaikhutdinov, S ^a   Todorova, T K ^b   Sierka, M ^b   Sauer, J ^b   Freund, H J ^a  

^a FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

^b HUMBOLDT UNIVERSITY   (Germany)

Author keywords

Density functional theory; Oxide surfaces; Photoelectron spectroscopy; Scanning tunneling microscopy; Silica; Thin oxide films; Vibrational spectroscopy

Indexed keywords

DENSITY FUNCTIONAL THEORY; OXIDE FILMS; PHOTOELECTRON SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY; SILICA; VIBRATIONAL SPECTROSCOPY;

OXIDE SURFACES; THIN OXIDE FILMS; ULTRA-THIN CRYSTALLINE SILICA FILMS;

THIN FILMS;

EID: 35448967910     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2007.07.030     Document Type: Article

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