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Volumn 555, Issue 1-3, 2004, Pages 101-117

V2O3(0 0 0 1) surface terminations: From oxygen- to vanadium-rich

Author keywords

Electron energy loss spectroscopy (EELS); Scanning tunneling microscopy; Vanadium oxide; X ray photoelectron spectroscopy

Indexed keywords

ABSORPTION SPECTROSCOPY; ANNEALING; COMPUTER SIMULATION; DEPOSITION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRONIC STRUCTURE; ENERGY DISSIPATION; EPITAXIAL GROWTH; INFRARED SPECTROSCOPY; LATTICE CONSTANTS; MONOLAYERS; SCANNING TUNNELING MICROSCOPY; SYNCHROTRON RADIATION; ULTRATHIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 1842527485     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2003.12.053     Document Type: Article
Times cited : (66)

References (34)
  • 34
    • 1842617026 scopus 로고    scopus 로고
    • J. Schoiswohl, M. Sock, G. Tzvetkov, F. Pfuner, S. Surnev, F.P. Netzer, in preparation
    • J. Schoiswohl, M. Sock, G. Tzvetkov, F. Pfuner, S. Surnev, F.P. Netzer, in preparation.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.