The structure of monolayer SiO2 on Mo(1 1 2): A 2-D [Si-O-Si] network or isolated [SiO4] units?

Surface Science

Volumn 600, Issue 19, 2006, Pages

  Chen, Mingshu ^a   Goodman, D Wayne ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

High resolution electron energy loss spectroscopy (HREELS); Infrared reflection absorption spectroscopy (IRAS); morphology; Scanning tunneling microscopy (STM); Silicon dioxide (SiO2); Surface structure

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; MOLECULAR VIBRATIONS; MONOLAYERS; MORPHOLOGY; PHOTOEMISSION; SCANNING TUNNELING MICROSCOPY; ULTRAVIOLET SPECTROSCOPY;

HIGH-RESOLUTION ELECTRON ENERGY LOSS SPECTROSCOPY (HREELS); INFRARED REFLECTION-ABSORPTION SPECTROSCOPY (IRAS); SURFACE STRUCTURES; ULTRA-VIOLET PHOTOEMISSION SPECTROSCOPY (UPS);

SILICA;

EID: 33749061664     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.07.024     Document Type: Article

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