Electronic and vibrational properties of ultrathin SiO2 films grown on Mo(112)

Physical Review B - Condensed Matter and Materials Physics

Volumn 72, Issue 11, 2005, Pages

  Wendt, S ^a   Ozensoy, E ^a   Wei, T ^a   Frerichs, M ^a   Cai, Y ^a   Chen, M S ^a   Goodman, D W ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 29744446437     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.72.115409     Document Type: Article

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