Ordered cerium oxide thin films grown on Ru(0001) and Ni(111)

Surface Science

Volumn 429, Issue 1, 1999, Pages 186-198

  Mullins, D R ^a   Radulovic, P V ^a   Overbury, S H ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CERIUM COMPOUNDS; CRYSTAL ORIENTATION; FILM GROWTH; LATTICE CONSTANTS; LOW ENERGY ELECTRON DIFFRACTION; NICKEL; OXYGEN; PRESSURE EFFECTS; RUTHENIUM; STOICHIOMETRY; SUBSTRATES; SURFACE STRUCTURE;

CERIUM OXIDE; ION SCATTERING SPECTROSCOPY; LOW INDEX SINGLE CRYSTAL SURFACE; OXYGEN PRESSURE; SOFT X RAY PHOTOELECTRON SPECTROSCOPY; SUBSTOICHIOMETRIC FILMS; SYNCHROTRON RADIATION PHOTOELECTRON SPECTROSCOPY;

THIN FILMS;

EID: 0032656094     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00369-6     Document Type: Article

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